Materials testing service
FIB Site-specific Sample Preparation
Use a focused ion beam to cut, lift out and thin a specified region for cross-section or TEM lamella preparation.
Discuss this test ↗
01 · Questions
What this test can help examine
- Site-specific sampling of defects or interfaces
- Device and film cross-sections
- TEM lamellae for downstream analysis
02 · Specimens
Information to prepare
- The target region and location evidence must be clear
- Optical, SEM or other reference images are recommended
- Size and conductivity require prior review
03 · Method
A route matched to the research question
Protective deposition, cutting, lift-out and progressive thinning are performed around the target; final thickness and field depend on the objective and material.
04 · Deliverables
What may be included
- Cross-section or lamella from the agreed target
- Key preparation images
- Specimen identification and downstream notes
05 · FAQ
Frequently asked questions
What should be confirmed before FIB preparation?
Provide the material type, specimen condition, question to be answered and any existing data. An engineer will confirm preparation, test conditions and deliverables.
How are turnaround time and specimen quantity determined?
Turnaround time and specimen quantity depend on specimen condition, test scope and analysis requirements, and are confirmed during technical review.