Professional MaterialsAnalysis Testing Platform

Send the material type, sample condition and testing goal. We will help match a suitable workflow.

It depends on the testing method. SEM, TEM, EBSD, FIB and section analysis may require different preparation steps.

Non-conductive samples may need gold or carbon coating to reduce charging effects before SEM observation.

The testing surface should be smooth and flat, with minimal residual deformation. Ion polishing or electrolytic polishing may be used.

FIB supports site-specific cutting and thinning, especially for cross-section or targeted TEM sample preparation.

It is commonly used to inspect cross-section structure, cracks, delamination, dimensions and local failure positions.

The report usually includes testing conditions, images or data, analysis notes and conclusion suggestions.

Powders, films, bulk materials or devices; The observation area must be electron transparent; Preparation depends on the target region.

Powder, bulk, film and device specimens; Specimens should be clean, dry and fit the stage; Non-conductive specimens may require coating.

Powder, bulk or film specimens; Quantity and surface requirements depend on mode; Phase fraction and crystallite state affect results.

Solid powder, bulk or film specimens; Surfaces should be protected from contamination; Vacuum compatibility and size require confirmation.

Failed parts and normal controls when available; Preserve the original condition and avoid cleaning or further damage; Provide service, material, process and failure history.