中Data Analysis WebsitePlace an order

Instrumentation · SINOMA

Preparation defineswhat analysis can reveal.

Connect sample preparation with electron microscopy to build a reliable path from the target area to observable evidence.

Explore equipment ↓
10listed instrumentsEquipment currently available to browse2capability groupsSample preparation and microscopy3core workflowsPreparation, TEM and SEM capability paths

Equipment directory

Find the instrument behind the method

Browse preparation and microscopy equipment by workflow and application.

Ion thinning instrumentSample preparation

Equipment profile

01

Ion thinning instrument

Ion thinning prepares TEM specimens for a wide range of materials without requiring electrical conductivity. An ion beam perforates the specimen to produce an electron-transparent center with a thicker surrounding region.

  • TEM preparation
  • Ion beam
  • No conductivity required
Discuss your testing needs ↗

Preparation to imaging

A clear route from the sample to the image.

  1. 01Define the target

    Confirm the region, scale and material condition.

  2. 02Prepare the specimen

    Select thinning, polishing or conductive coating.

  3. 03Select microscopy

    Match TEM or SEM capability to the question.

Choose with context

The instrument follows the question.

Share the material, sample condition and target scale with an engineer.

Place an order ↗